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Jiapu Instrument (Suzhou) Co., Ltd
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Jiapu Instrument (Suzhou) Co., Ltd

  • E-mail

    896757229@qq.com

  • Phone

    18013500325

  • Address

    Building 3, No. 85 Zijin Road, Huqiu District, Suzhou City, Jiangsu Province

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Coating thickness gauge

NegotiableUpdate on 02/14
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Overview
The T-450 coating thickness gauge process uses the principle of electrolysis to lay a layer of metal on a conductive material to form a coating. The performance of the coating is different from that of the base metal and has new characteristics.
Product Details

T-450Coating thickness gaugeIt is a widely used energy dispersive X-ray fluorescence coating thickness measurement and material analyzer. It is highly suitable for non-destructive measurement of coating thickness, material analysis, and solution analysis, and can also detect coatings on mass-produced components and printed circuit boards. Suitable for quality control, incoming inspection, and production process monitoring by customers.

Product performance

Stability: T-450 has good long-term stability and does not require frequent instrument calibration.

No need to prepare samples: Whether for coating systems or solid and liquid samples, the instrument can measure and analyze without standard plates.

Comprehensive performance: Coating analysis, qualitative analysis, quantitative analysis, plating solution analysis, statistical function

Technical Specifications

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T-450Coating thickness gaugeJob characteristics

·Measure 5 layers (4 layers of coating+substrate layer) of coating, analyze 15 elements simultaneously, and automatically correct X-ray overlapping spectral lines

·High measurement accuracy, good stability, and accurate measurement results up to uin

·Fast non-destructive measurement with short measurement time, obtaining measurement results within 10 seconds at the fastest

·Can analyze solids and solutions; Qualitative, semi quantitative, and quantitative analysis

·Material identification and classification testing, analysis of materials and alloy elements, qualitative analysis of element spectra

·Powerful data statistics and processing capabilities: mean, standard deviation, relative standard deviation, maximum, minimum, etc

·Result output: direct printing or one click export to PDF or Excel files; The report includes data, images, statistical charts, customer information, etc

·Measurement position preview function; High resolution color CCD sample observation system with a standard optical magnification of 30x

·Provide global services and technical support