-
E-mail
sales@e-xina.com
- Phone
-
Address
22D, Block A, Hechuan Building, No. 235 Nanjing Road, Heping District, Tianjin
Tianjin Sina Intelligent Technology Co., Ltd
sales@e-xina.com
22D, Block A, Hechuan Building, No. 235 Nanjing Road, Heping District, Tianjin
the United StatesFormFactor probe
Brand Introduction:
FormFactor was founded in 1993 and is a provider of basic testing and measurement technologies. Semiconductor companies rely on our products and services to optimize equipment performance and improve yield knowledge, thereby increasing profitability. We constantly strive to help our customers solve the testing and measurement challenges faced by the broader semiconductor industry. The company has 10 design offices, 23 service and maintenance offices, and 13 sales offices. Through continuous research and innovation, we provide high-quality products and services to meet customer needs.
Product range:
the United StatesFormFactor probe, probe station, probe.
Main models:
MPC150, PM8/EPS200, CM300, PM300, DCP 100 series, DCP-HTR series
Related product introduction:
DC-Q probe
The DCQ probe uses impedance controlled ceramic blade needles to achieve low noise and high performance. This pin type can accommodate high-quality bypass capacitors because they are very close together, resulting in a small series inductance. All pins are connected to a common ground plane, but individual pins can be easily (grounded) isolated to achieve additional low noise performance. The standard configuration Max can use 16 needles, while the customized configuration Max can use 24 needles.
Main functions:
-Power bypass inductance: 8 nH
-The standard DCQ probe has a flat head needle, which can be made of nickel plated tungsten or BeCu, with diameters of 0.75 mil, 1.0 mil, and 1.5 mil, respectively.
-Supports collinear and non-standard needle configurations
-Standard configuration: Max16 DC; Custom Max 24 DC
-Ideal choice for detecting the entire circuit for functional testing
-DC probe can provide power or slow logic for the tested circuit
probe station-MPS150
Main functions:
flexibility
-RF, Millimeter wave and sub THz characterization, FA,DWC,MEMS, Ideal choice for various applications such as optoelectronic testing and WL
-Can be reconfigured and upgraded as demand grows
-Max minimizes setup time without compromising performance or accuracy
-Seamless integration of various measuring instruments
stability
-Solid station frame
-The built-in vibration isolation solution can achieve vibration reduction effect
-Rigid microscope bridge
-Compact and sturdy mechanical design
-Highly accurate measurement results
-MPC150- Thin Design
easy to use
-Ergonomic design, simple and easy to use
-Low profile design
-Simple microscope operation
-Quick and ergonomic DUT replacement through pull-out stage
-Reduce training workload
-Quickly obtain data
-Easy to operate