Glass wafer transmittance testing institution, wafer testing center

Glass wafers are the core substrates of semiconductors and display devices, and their detection directly determines the accuracy and performance of downstream products. Through micrometer level precision testing, key indicators such as wafer flatness and transparency can be accurately controlled to ensure compatibility with precision processing requirements in photolithography, packaging, and other processes. This provides reliable substrate support for products such as chips and OLED screens, and is the core link of quality control in the electronic information industry.

GB/T 30458 Glass substrates for LCD display devices

GB/T 2680 Determination of Visible Light Transmittance, Direct Solar Transmittance, and Total Solar Transmittance of Building Glass

SJ/T 11464 Glass Materials for Semiconductor Devices

ISO 12215 Test Methods for Dimensions and Surface Quality of Electronic Glass

GB/T 7962 Test Method for Colorless Optical Glass

Dimensional accuracy, thickness deviation, flatness, surface roughness, transmittance, refractive index, haze, stress distribution, defect detection, chemical stability, thermal expansion coefficient, impact resistance, hardness, density, acid resistance, alkali resistance

[Scope of Detection]

By application field: semiconductor packaging glass wafer, display panel glass wafer, optical device glass wafer, sensor glass wafer by material type: quartz glass wafer, borosilicate glass wafer, aluminum silicate glass wafer, sodium calcium glass wafer by size specifications: 4-inch glass wafer, 6-inch glass wafer, 8-inch glass wafer, 12 inch glass wafer

【 Instruments and Equipment 】

Currently equipped with X-ray fluorescence spectrometer (XRF), Abbe refractometer, closed flash point automatic analyzer, infrared spectrometer (IR), flame photometer, rapid solvent extractor, inductively coupled plasma spectrometer (ICP), inductively coupled plasma mass spectrometer (ICP-MS), headspace gas chromatography-mass spectrometry (HS-GCMS), trap headspace gas chromatography-mass spectrometry (PT-GCMS), constant temperature and humidity system, ion chromatography (IC), gas chromatography (GC), gas chromatography-mass spectrometry (GCMS), gas chromatography-mass spectrometry (pyrolysis) GC-MS (PY), thermal desorption GCMS, oscillopolarography, balance, microwave digestion, etc. Instrument, Micro Infrared Spectrometer (FT-IR), Microscope, Rotary Evaporator, Liquid Chromatography Tandem Mass Spectrometer (LC-MS), UV Visible Spectrophotometer (UV) Liquid chromatography, atomic fluorescence spectroscopy (AFS), fluorescence whiteness meter, atomic absorption spectroscopy (AAS).

【 Qualification Certificate 】

We have obtained qualification certificates for inspection and testing institutions (CMA qualification certificate), laboratory accreditation certificate of China National Accreditation Service for Conformity Assessment (CNAS qualification certificate), assessment qualification certificate for agricultural product quality and safety testing institutions (CATL qualification certificate), quality management system, environmental management system, occupational health and safety management system certification, etc. The Anhui Qingxi Judicial Appraisal Institute, a directly affiliated institution, has been granted a judicial appraisal license and has passed 34 capability verifications by the Judicial Appraisal Science Research Institute.

Our institute produces over 20000 reports annually and serves more than 45000 clients, including corporate units, universities and research institutes, Fortune 500 companies, multinational corporations, etc.

Glass wafer transmittance testing institution, wafer testing center