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E-mail
zhixuling789@126.com
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18810401088
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Fengtai District
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Beijing Zhongke Fuhua Technology Co., Ltd
Desktop scanning electron microscope
NegotiableUpdate on 02/01
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Overview
The ZEM series desktop scanning electron microscope, with its imaging technology and portability, meets diverse application scenarios. This series of products, with its positioning and series layout in the domestic market, has achieved key performance indicators such as imaging clarity, ease of operation, and system integration that are in line with international standards. The $r $n $r $nZEM series, with its high integration and diverse configuration options, makes operation simple and intuitive, allowing even non professionals to quickly master it. The accompanying software supports the entire workflow, from sample preparation to parameter adjustment, to final imaging analysis, providing an integrated and efficient solution
Product Details
• Product parameters
| Key Metrics | ZEM18 |
| accelerating voltage | Maximum 18kV |
| resolution | Better than 6nm |
| magnification | 200000 |
| Filament type | Centered cartridge filament |
| Sample change time | 1min30s |
| Vacuum mode | 高真空 Low vacuum (1-60Pa) (optional) |
| Sample stage movement range | Two axis sample stage Three axis sample stage (optional) |
| Navigation camera | Optical Navigation |
| detector | BSE，SE |
| expansion capability | EDS、 Deceleration sample stage, in-situ stage |
• Product Features
▲ Fully functional: It has multiple functions to meet the needs of different users.
▲ Quick Vacuum Extraction: Vacuum extraction can be completed within 90 seconds, improving work efficiency.
▲ Smooth imaging: Fast imaging speed, no ghosting or dragging, clear display of sample details.
▲ Acceleration voltage: 3-18kV continuously adjustable, 1kV step, providing flexible voltage selection.
▲ Diverse signals: Three types of signal detectors, SE, BSE, and EDS, can be optionally equipped to achieve composition and morphology analysis.
▲ Rich Expansion: It has rich in-situ expansion functions and is compatible with self-developed in-situ electron microscope accessories, such as heating stage, TEC cold stage, etc.
• Real time case studies
